Mosaid Technologies Inc. rolled out its latest memory test system for use in engineering test, analysis and bitmapping applications.
The MS5205 from Mosaid is said to test DRAMs, flash, embedded memory and mixed memory/logic devices, said Glenn Evans, general manager of the Systems Division at Mosaid (Ottawa).
The tester is said to support 72 data I/O pins and 72 address/clock pins, testing at up to 400-Mbps in the double data rate mode.
"Fully configured, the MS5205 offers double the number of data I/O pins and address/clock pins at a significantly reduced cost per pin compared to the MS4205 — and adds logic vectors to every pin,” he said in a statement.
Key MS5205 features include increased bitmapping capability from 8- to 16-Gb, coupled with faster filing and display times for topologically correct bitmaps. It also has anew remote test head, which conforms to the PXI standard.
The selling price for the MS5205 ranges from $350,000 to $750,000, depending on the configuration. First customer shipments are scheduled for January 2006.